The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Aug. 08, 2018
Applicants:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Paul P. Woskov, Bedford, MA (US);

Inventors:

Ryan D. Murphy, Tigard, OR (US);

Eric C. Forrest, Sandia Park, NM (US);

Paul P. Woskov, Bedford, MA (US);

Joshua Stanford, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/00 (2006.01); G01J 5/00 (2006.01); G01K 15/00 (2006.01); G01J 5/02 (2006.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
G01J 5/025 (2013.01); H04N 5/33 (2013.01); G01J 2005/0051 (2013.01); G01J 2005/0059 (2013.01); G01J 2005/0062 (2013.01); G01J 2005/0077 (2013.01);
Abstract

An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.


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