The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Feb. 22, 2018
Applicant:

Witec Wissenschaftliche Instrumente Und Technologie Gmbh, Ulm, DE;

Inventors:

Peter Spizig, Ulm, DE;

Olaf Hollricher, Neu-Ulm, DE;

Wolfram Ibach, Ulm-Lehr, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/44 (2013.01); G01N 21/6458 (2013.01); G01N 21/65 (2013.01); G02B 21/0076 (2013.01);
Abstract

A method and a device are provided which enables a simple and fast Raman and/or fluorescence measurement even on uneven specimen surfaces; additionally, the invention should make it possible to confocally image a plane or a surface, in particular a surface of a specimen, i.e. with the aid of confocal microscopy.


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