The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Oct. 21, 2019
Applicant:

Youv Labs, Inc., New York, NY (US);

Inventors:

Emmanuel Dumont, New York, NY (US);

Peter Kaplan, Montclair, NJ (US);

Assignee:

YouV Labs, Inc., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01J 1/42 (2006.01); G01J 1/16 (2006.01); G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
G01J 1/429 (2013.01); G01J 1/0488 (2013.01); G01J 1/16 (2013.01); G01J 1/44 (2013.01); G01J 2001/1657 (2013.01); G01J 2001/444 (2013.01);
Abstract

Methods of accurately estimating erythemaly-weighted UV exposure, such as the UV Index, and sensors adapted for the same.


Find Patent Forward Citations

Dumont, Emmanuel. (2020). Methods, systems, and apparatuses for accurate measurement of health relevant uv exposure from sunlight (U.S. Patent No. 10876886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10876886

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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