The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jun. 26, 2019
Honeywell International Inc., Morris Plains, NJ (US);
Tobias Nebel, North Vancouver, CA;
Sebastien Tixier, North Vancouver, CA;
Michael Kon Yew Hughes, Vancouver, CA;
Paul Mounter, Vancouver, CA;
Honeywell International Inc., Charlotte, NC (US);
Abstract
A measurement apparatus includes a first sensor, scanner head, and computing device coupled to the first sensor that stores relative signal level ranges at selected spectral marker region(s) compared to a common region each corresponding to a composite sheet material grade and an associated sensor calibration. The computing device measures a first signal in the spectral marker region and a second signal in the common region of a composite sheet including a sheet material and a high-z material, determining a current relative signal level comparing a current signal level of the first and second signal, and identifying a current composite sheet material grade for the composite sheet from the composite material grades using the current relative signal level. Based on the current composite material grade a current sensor calibration is chosen from the sensor calibrations, and ≥1 physical parameter for the composite sheet is determined from the current sensor calibration.