The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Sep. 19, 2016
Applicant:
Vega Grieshaber KG, Wolfach, DE;
Inventor:
Guenter Kech, Wolfach, DE;
Assignee:
VEGA GRIESHABER KG, Wolfach, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01F 22/00 (2006.01); G01S 13/88 (2006.01); G01S 7/00 (2006.01); G01S 13/87 (2006.01); G01F 23/00 (2006.01); G01F 23/28 (2006.01); G01S 13/89 (2006.01); G01B 15/04 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01B 15/04 (2013.01); G01F 22/00 (2013.01); G01F 23/0076 (2013.01); G01F 23/28 (2013.01); G01S 7/003 (2013.01); G01S 13/87 (2013.01); G01S 13/88 (2013.01); G01S 13/89 (2013.01);
Abstract
A fill level measurement system for detecting a topology of a filling material surface or a volume of a filling material in a container including a master device and one or more slave devices, the master device being designed to transmit control signals to the slave device. As the slave devices do not include all the functionalities of an independent fill level measurement device, the slave devices can be produced in a cost-effective manner.