The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Nov. 13, 2017
Chevron U.s.a. Inc., San Ramon, CA (US);
University of Southern California, Los Angeles, CA (US);
Alisha Deshpande, Houston, TX (US);
Si-Zhao J. Qin, Los Angeles, CA (US);
Lisa Ann Brenskelle, Houston, TX (US);
Chevron U.S.A. Inc., San Ramon, CA (US);
University of Southern California, Los Angeles, CA (US);
Abstract
Methods and systems for detecting a fault in a data set from an industrial process are disclosed. One method includes forming a first data matrix at a data processing framework from time-series training data, and performing a principal component pursuit on the first data matrix to form an uncorrupted, unscaled matrix and a sparse matrix in the memory, and scaling the uncorrupted, unscaled matrix to form an uncorrupted scaled matrix. The method also includes performing a dynamic principal component analysis (DPCA) on the uncorrupted scaled matrix to form a DPCA model, and determining a squared prediction error from the DPCA model. Based on the squared prediction error, faults are detected in a different data set from operation of the industrial process. At least one of (1) correcting the one or more faults in the different data set or (2) performing a repair operation on a sensor is performed.