The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Mar. 11, 2019
Honeywell International Inc., Morris Plains, NJ (US);
Michael Kon Yew Hughes, Vancouver, CA;
Honeywell International Inc., Charlotte, NC (US);
Abstract
A non-contact thickness measurement system includes a first optical displacement sensor in a first scanner head and a second optical displacement sensor in a second scanner head on opposite sides of a sheet material. The displacement sensors measure a plurality of distances to a first line in a first direction along the top of the material and plurality of distances to a second line in a second direction along a bottom of the material. An x,y position sensor determines x,y position data. A z-position sensor measures a sensor-to-sensor distance. A computing device determines a projected intersection point of the first and second lines, and using the projected intersection point selects a first distance from the distances from first displacement sensor and a second distance from the distances from the second displacement sensor, and for calculating a sheet material thickness using the first distance, second distance, and the sensor-to-sensor distance.