The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Apr. 30, 2018
Applicant:

Shui T. Lai, Windermere, FL (US);

Inventor:

Shui T. Lai, Windermere, FL (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/008 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
A61B 3/107 (2013.01); A61F 9/00829 (2013.01); A61F 2009/0088 (2013.01); A61F 2009/00872 (2013.01); A61F 2009/00897 (2013.01);
Abstract

A method of correcting wavefront aberrations of an eye includes determining a high precision conventional intrastromal corneal ablation profile based on a direct removal of the intrastromal corneal tissue. An expanded ablation volume profile is constructed based on the direct tissue removal profile and the expanded tissue volume is to be ablated instead to correct to the wavefront aberrations. The thickness of the ablated profile of a conventional ablation profile is expanded by an expansion factor (Nc−1)/(Nm−Nc), Nc is the index of refraction of the cornea and Nm the index of fill material. An expanded ablation volume filled with the fill material produces the effect of correcting wavefront aberrations as if a much smaller tissue volume were ablated without the fill material.


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