The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Jan. 23, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Bernhard Nitsch, Munich, DE;
Adrian Ispas, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A jitter decomposition method for decomposing several jitter and noise components contained in an input signal, wherein the input signal is generated by a signal source, is disclosed. The jitter decomposition method comprises: receiving the input signal; at least one of determining and receiving a reconstructed data dependent jitter signal; at least one of determining and receiving an impulse response, the impulse response being associated with at least the signal source; and determining at least a first statistical parameter being associated with a first jitter component or a first noise component in the input signal and a second statistical parameter being associated with a second jitter component or a second noise component in the input signal, the second jitter component or the second noise component being different from the first jitter component or the first noise component, respectively. The first statistical parameter and the second statistical parameter are determined by applying a statistical method at two different times, wherein the first statistical parameter and the second statistical parameter are each determined based on at least one of the reconstructed data dependent jitter signal and the impulse response. Moreover, a measurement instrument is disclosed.