The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Dec. 24, 2019
Applicant:
Yuan-ju Chao, Cupertino, CA (US);
Inventor:
Yuan-Ju Chao, Cupertino, CA (US);
Assignee:
IPGREAT INCORPORATED, Grand Cayman, KY;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01);
Abstract
A method of enabling full speed test and characterization for high-speed Digital-to-Analog Converter (DAC) by employing an on-chip pattern generator. The test pattern is written to the on-chip pattern generator through a low data rate Integrated circuit (IC) interface, and the pattern generator is then enabled and coupled to DAC to facilitate full speed test for DAC. This method does not require extra input/output pin or extra process and minimize design complexity.