The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Nov. 05, 2019
Decision Sciences International Corporation, Poway, CA (US);
Konstantin Borozdin, Albuquerque, NM (US);
Decision Sciences International Corporation, Poway, CA (US);
Abstract
Systems, devices and methods for inspecting and imaging of contents of a volume is disclosed. One implementation of the disclosed systems, devices and methods includes an apparatus for inspecting and imaging of contents of a volume of interest which includes a first particle tracking unit of detectors to receive incoming charged particles that transit through an object and to measure position and direction of the charged particles that transit through the object while allowing the charged particles to pass through, and a second particle tracking unit of detectors installed relative to the first particle tracking unit of detectors and to the volume of interest containing the object of inspection so that it is positioned to receive the outgoing charged particles that transit through the first particle tracking unit and transit through the object of inspection and to measure a position and a direction of the outgoing charged particles. The apparatus also includes a processor that processes information from the first and second particle tracking units of detectors to yield an estimate of a spatial map of atomic number and a density of the object. The methods disclosed here include triggering algorithms for signal selection, positional calibration algorithms for locating particle tracking units in absolute three dimensional coordinate space, and three-dimensional tomographic image reconstruction algorithms combining the tracking information from multiple pairs of particle tracking units.