The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Jan. 10, 2019
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Andrii But, Kyiv, UA;
Ivan Safonov, Kyiv, UA;
Konstantin Morozov, Kyiv, UA;
Ruslan Iermolenko, Kyiv, UA;
Yaroslav Lavrenyuk, Kyiv, UA;
Abstract
A method and device are provided for obtaining a 3D image. The method includes sequentially projecting a plurality of beams to an object, each of the plurality of projected beams corresponding to a respective one of a plurality of sectors included in a pattern; detecting a plurality of beams reflected off of the object corresponding to the plurality of projected beams; identifying time-of-flight (ToF) of each of the plurality of projected beams based on the plurality of detected beams; identifying a distortion of the pattern, which is caused by the object, based on the plurality of detected beams; and generating a depth map for the object based on the distortion of the pattern and the ToF of each of the plurality of projected beams, wherein the plurality of detected beams are commonly used to identify the ToF and the distortion of the pattern.