The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Oct. 24, 2018
Fluke Corporation, Everett, WA (US);
Kirk R. Johnson, Rogers, MN (US);
Matthew F. Schmidt, River Falls, WI (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods directed toward combining visible light and infrared images can include processing visible light image data to determine an edge factor value for a plurality of visible light pixels corresponding to the strength of an edge at that location. The edge factor value can be determined using features from the visible light image data and an edge gain input, which may be adjustable by a user. The edge factor values are combined with an edge midscale value to create a first set of modified visible light image data including pixels emphasized based on the strength of the edge in the visible light image. The modified visible light image data is combined with infrared image data to create combined image data having contribution from the infrared image data and the edge factor values from the visible light image data.