The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Oct. 26, 2017
Applicant:
Hitachi High-technologies Corporation, Tokyo, JP;
Inventors:
Hideharu Hattori, Tokyo, JP;
Kenko Uchida, Tokyo, JP;
Sadamitsu Aso, Tokyo, JP;
Toshinari Sakurai, Tokyo, JP;
Yasuki Kakishita, Tokyo, JP;
Assignee:
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 1/00 (2006.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G01N 15/00 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 15/00 (2013.01); G01N 33/48 (2013.01); G06K 9/00147 (2013.01); G06T 1/0007 (2013.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G06K 9/0014 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01);
Abstract
A diagnostic imaging assistance apparatus according to the present invention performs a process of inputting images of a tissue and a cell, a process of extracting feature amounts of a wide view and a narrow view from a target image to be processed, a process of classifying whether the target images having different views are normal or abnormal from the feature amounts, and a process of classifying a lesion likelihood using a classification result.