The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Nov. 17, 2016
Aptiv Technologies Limited, St. Michael, BB;
Rafal Dlugosz, Poznan, PL;
Waldemar Dworakowski, Cracow, PL;
Zofia Dlugosz, Lubon, PL;
Krzysztof Gongolewski, Cracow, PL;
Aptiv Technologies Limited, St. Michael, BB;
Abstract
A method for identification of characteristic points of a calibration pattern within an image includes: (i) overlaying a template arrangement of template points over the candidate point such that a principal point of the template points coincides with the candidate point, wherein the template arrangement corresponds to the calibration pattern or to a sub-pattern of the calibration pattern, (ii) for each template point of the template arrangement, except the principal point, identifying from the set of candidate points the candidate point closest to the template point, and (iii) determining a degree of deviation by summing the distances between each template point of the template arrangement, except the principal point, and the candidate point closest to this template point; and identifying as characteristic points of the calibration pattern all those candidate points of the set of candidate points with a degree of deviation below a deviation threshold.