The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Dec. 10, 2014
Applicant:
Ictk Co., Ltd., Gyeonggi-do, KR;
Inventors:
Dong Kyue Kim, Seoul, KR;
Byong Deok Choi, Seoul, KR;
Assignee:
ICTK HOLDINGS CO., LTD., Seoul, KR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/71 (2013.01); G06F 21/73 (2013.01); H04L 9/08 (2006.01); G09C 1/00 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G06F 21/71 (2013.01); G06F 21/73 (2013.01); G09C 1/00 (2013.01); H04L 9/0866 (2013.01); H04L 9/3278 (2013.01);
Abstract
Provided is an apparatus for testing randomness of a digital value and processing the digital value. The digital value may include first bit sequences generated by a physically unclonable function (PUF). A grouping unit may generate a plurality of groups by segmenting the first bit sequence, and a processing unit may calculate a second bit sequence from the plurality of groups by performing a logical operation.