The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Nov. 27, 2018
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventors:
Assignee:
Fanuc Corporation, Yamanashi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G05B 2219/34475 (2013.01); G06N 20/00 (2019.01);
Abstract
A numerical controller that detects occurrence of an abnormality according to a neighborhood method includes a sampling value acquisition unit configured to collect sampling values indicative of a state of a machine or environment, wherein the sampling values are collected during normal machining and during operation; a learning unit configured to generate a set of the sampling values during the normal machining; and an abnormality degree determination unit configured to compute an abnormality degree on the basis of a distance between the sampling value during the operation and the set of the sampling values during the normal machining.