The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Sep. 25, 2015
Applicant:
Battelle Memorial Institute, Columbus, OH (US);
Inventors:
Eric Atherton, Middletown, NJ (US);
Matthew Aderholdt, Vineland, NJ (US);
Joseph Regensburger, Grove City, OH (US);
Lucinda Flaherty, Bradenton, FL (US);
Joseph Cochran, Egg Harbor Township, NJ (US);
Assignee:
Battelle Memorial Institute, Columbus, OH (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01V 13/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/005 (2013.01); G01V 5/0008 (2013.01); G01V 13/00 (2013.01);
Abstract
Systems, methods, and apparatuses are provided for evaluating an image quality of an image produced by an x-ray computed tomography (CT) system. The system includes at least one test article configured to support one or more test objects within an inner volume. The test article includes an exterior shell assembly, a base assembly, a support structure.