The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Jan. 08, 2018
Applicant:
Microvision, Inc., Redmond, WA (US);
Inventors:
P. Selvan Viswanathan, Bellevue, WA (US);
Bin Xue, Mukilteo, WA (US);
Assignee:
Microvision, Inc., Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/10 (2020.01); G02B 26/10 (2006.01); G01S 7/4865 (2020.01); G01S 7/4861 (2020.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 17/10 (2013.01); G01S 7/4815 (2013.01); G01S 7/4861 (2013.01); G01S 7/4865 (2013.01); G01S 17/89 (2013.01); G02B 26/105 (2013.01);
Abstract
Laser light pulses of at least two different wavelengths are reflected off a scanning mirror. A first time-of-flight distance measurement circuit receives reflected light pulses of a first wavelength and determines distances. A second time-of-flight distance measurement circuit receives reflected light pulses of a second wavelength and determines distances. The laser light pulses of different wavelengths may be interleaved in time to increase resolution. The laser light pulses of different wavelengths may also be used for detecting safety violations and/or power control.