The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Dec. 14, 2017
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:
Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01); G01R 31/3187 (2006.01); G01R 31/319 (2006.01); G06F 11/27 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01); G01R 31/3187 (2013.01); G01R 31/31915 (2013.01); G01R 31/318505 (2013.01); G01R 31/318533 (2013.01); G06F 11/27 (2013.01);
Abstract

An integrated circuit comprising: a plurality of on-chip-instrument-modules; a test-controller-module configured to communicate data with the plurality of on-chip-instrument-modules; a functional-module configured to communicate data with the plurality of on-chip-instrument-modules; and an on-chip-instrument-controller. The on-chip-instrument controller is configured to: for each of the plurality of on-chip-instrument-modules, store an access-indicator; and based on a value of the access-indicator for each on-chip-instrument-module, enable the on-chip-instrument-module to communicate with either: the test-controller-module; or the functional-module.


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