The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Jun. 30, 2018
Anritsu Company, Morgan Hill, CA (US);
Thomas Roberts, Morgan Hill, CA (US);
Karam Noujeim, Los Altos, CA (US);
ANRITSU COMPANY, Morgan Hill, CA (US);
Abstract
A system for measuring an electrical response of a device under test (DUT) includes a reflectometer with reduced heat dissipation used with a vector network analyzer (VNA). The reflectometer is tethered to the VNA using a tether of scalable length which carries low frequencies. The reflectometer has a distributed harmonic generator including a non-linear transmission line (NLTL) for multiplying a frequency of an RF signal received from the VNA to generate a test signal having a frequency in the millimeter wave range at a test port connected to the DUT. A sampler in the reflectometer receives a local oscillator (LO) signal from the VNA and includes another NLTL for receiving the LO signal and generating pulses at a frequency in the millimeter wave range. When the test signal is transmitted to the DUT, the sampler outputs intermediate frequency signals which are transmitted to the VNA for characterization of the DUT.