The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

May. 11, 2020
Applicant:

Resman As, Trondheim, NO;

Inventor:

Fridtjof Nyhavn, Trondheim, NO;

Assignee:

RESMAN AS, Trondheim, NO;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 9/00 (2006.01); E21B 27/02 (2006.01); E21B 43/14 (2006.01); E21B 47/11 (2012.01);
U.S. Cl.
CPC ...
E21B 47/11 (2020.05); E21B 27/02 (2013.01); E21B 43/14 (2013.01); G01V 9/00 (2013.01);
Abstract

A method of estimating an influx profile for at least one well fluid to a producing petroleum well with two or more influx zones or influx locations to a production flow, wherein the well comprises tracer sources with distinct tracer materials in known levels of the well, at least one of said tracer sources arranged downstream and exposed to the fluids in at least one of said influx zones, wherein each said tracer source has an even release rate to said well fluid, characterised in that one or more of the tracer sources is provided in one or more delay chambers for ventilating out fluid with leaked tracer material at a time constant which is significantly longer than the diffusion rate from the tracer source to the well fluid, wherein the method further comprises: providing samples, the samples collected from the production flow at a location downstream of the tracer sources during a time period in which the tracer transient is detectable at the downstream location, analysing said samples for concentration and type of tracer material from said possible tracer sources as a function of sampling time or cumulative produced volume; and based on said measured concentrations and their sampling time or cumulative produced volume, calculating said influx volumes.


Find Patent Forward Citations

Loading…