The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Feb. 22, 2017
Applicants:

Psm International, Inc., Tokyo, JP;

Procemex Oy, Jyskae, FI;

Inventor:

Hisataka Shitara, Tokyo, JP;

Assignees:

PSM INTERNATIONAL, INC., Tokyo, JP;

PROCEMEX OY, Jyskae, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 7/06 (2006.01); G01B 11/08 (2006.01); G01B 21/08 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
D21F 7/06 (2013.01); G01B 11/06 (2013.01); G01B 11/08 (2013.01); G01B 21/08 (2013.01);
Abstract

A method of measuring the thickness of long sheet material wound on to a reel spool while being pressed by a reel drum, includes: measuring the increase in the roll diameter of the wound roll formed from the long sheet material in a non-contact manner; measuring the number of rotations of the reel spool; and determining the thickness of the long sheet material by calculation using the measured increase in the roll diameter and the number of rotations.


Find Patent Forward Citations

Shitara, Hisataka. (2020). Method of measuring thickness of long sheet material and thickness measuring system (U.S. Patent No. 10870948). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10870948

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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