The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2020
Filed:
Mar. 18, 2016
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Steffen Renisch, Eindhoven, NL;
Nicole Schadewaldt, Eindhoven, NL;
Sven Prevrhal, Eindhoven, NL;
Heinrich Schulz, Eindhoven, NL;
Thomas Blaffert, Eindhoven, NL;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01); A61B 5/055 (2006.01); A61B 5/00 (2006.01); G01R 33/56 (2006.01); G01R 33/48 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1039 (2013.01); A61B 5/0033 (2013.01); A61B 5/055 (2013.01); A61B 5/45 (2013.01); A61B 5/7278 (2013.01); A61N 5/1031 (2013.01); G01R 33/4812 (2013.01); G01R 33/5608 (2013.01); A61B 5/0035 (2013.01); A61B 5/748 (2013.01); A61B 2576/00 (2013.01); G01R 33/543 (2013.01);
Abstract
The present invention teaches a method and system for computing an alternative electron density map of an examination volume. The processing system is configured to compute a first electron density map using a plurality of imaging data, compute a second electron density map, wherein the second electron density map is a simplified version of the first electron density map, and compute the alternative electron density map, using the first electron density map and the second electron density map.