The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Apr. 12, 2018
Applicant:

Canon Medical Systems Corporation, Otawara, JP;

Inventors:

Jian Zhou, Vernon Hills, IL (US);

Zhou Yu, Vernon Hills, IL (US);

Yan Liu, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/025 (2013.01); A61B 6/0407 (2013.01); A61B 6/4208 (2013.01); A61B 6/502 (2013.01); A61B 6/582 (2013.01);
Abstract

An apparatus and method are described using a forward model to correct pulse pileup in spectrally resolved X-ray projection data from photon-counting detectors (PCDs). To calibrate the forward model, which represents each order of pileup using a respective pileup response matrix (PRM), an optimization search determines the elements of the PRMs that optimize an objective function measuring agreement between the spectra of recorded counts affected by pulse pileup and the estimated counts generated using forward model of pulse pileup. The spectrum of the recorded counts in the projection data is corrected using the calibrated forward model, by determining an argument value that optimizes the objective function, the argument being either a corrected X-ray spectrum or the projection lengths of a material decomposition. Images for material components of the material decomposition are then reconstructed using the corrected projection data.


Find Patent Forward Citations

Zhou, Jian. (2020). Method and apparatus for computed tomography (ct) and material decomposition with pile-up correction calibrated using real pulse pileup effect and detector response (U.S. Patent No. 10869646). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10869646

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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