The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Jul. 07, 2015
Hfi Innovation Inc., Zhubei, TW;
Shan Liu, San Jose, CA (US);
Wang-Lin Lai, San Jose, CA (US);
Tzu-Der Chuang, Zhubei, TW;
Ching-Yeh Chen, Taipei, TW;
Yu-Wen Huang, Taipei, TW;
Chih-Wei Hsu, Taipei, TW;
Xiaozhong Xu, Fremont, CA (US);
HFI Innovation Inc., Zhubei, TW;
Abstract
A method of IntraBC coding using restricted reference area is disclosed. A reference block is selected from an available ladder-shaped reference area comprising previously processed blocks before the current working block in the current CTU row and previously processed blocks in one or more previous CTU rows. A location of a last previously processed block of a second previous CTU row that is one CTU row farther away from the current CTU row than a first previous CTU row is always in a same vertical location or after a same vertical position of a last previously processed block of the first previous CTU row. The current picture may be partitioned into multiple CTU rows for applying wavefront parallel processing (WPP) on the multiple CTU rows, where the current working block corresponds to a current working block. Similar restrictions may also be applied to slice/tile-based parallel processing.