The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Sep. 11, 2019
Applicant:

Murata Manufacturing Co., Ltd., Kyoto-fu, JP;

Inventors:

Kenji Sasaki, Nagaokakyo, JP;

Kingo Kurotani, Nagaokakyo, JP;

Takashi Kitahara, Nagaokakyo, JP;

Shigeki Koya, Nagaokakyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/737 (2006.01); H01L 23/00 (2006.01); H01L 23/482 (2006.01); H01L 29/417 (2006.01); H01L 29/06 (2006.01); H01L 23/535 (2006.01); H01L 27/082 (2006.01); H01L 29/40 (2006.01); H03F 3/19 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7371 (2013.01); H01L 23/4824 (2013.01); H01L 23/535 (2013.01); H01L 24/13 (2013.01); H01L 27/0823 (2013.01); H01L 29/0692 (2013.01); H01L 29/40 (2013.01); H01L 29/41708 (2013.01); H03F 3/19 (2013.01); H01L 24/05 (2013.01); H01L 24/16 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/1302 (2013.01); H01L 2224/13013 (2013.01); H01L 2224/16227 (2013.01); H01L 2924/13051 (2013.01); H03F 2200/408 (2013.01); H03F 2200/451 (2013.01);
Abstract

A semiconductor device includes a heterojunction bipolar transistor and a bump. The heterojunction bipolar transistor (HBT) includes a plurality of unit transistors. The bump is electrically connected to emitters of the plurality of unit transistors through respective overlying conductor filled via openings that overlap in a plan view with a width portion of the bump. The semiconductor device reduces heat resistance in an HBT cell by satisfying two conditions, the first of which is related to specific sizing and positioning of a width portion of the overlying via opening relative to the width portion of the bump, and the second of which is related to positioning the base electrode entirely within a specific region of the width portion of the overlapping overlying via opening.


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