The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

May. 13, 2019
Applicant:

Shanghai Huali Microelectronics Corporation, Shanghai, CN;

Inventors:

Runling Li, Shanghai, CN;

Haifeng Zhou, Shanghai, CN;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/165 (2006.01); H01L 29/08 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66636 (2013.01); H01L 21/0243 (2013.01); H01L 21/0245 (2013.01); H01L 21/0251 (2013.01); H01L 21/02447 (2013.01); H01L 21/02529 (2013.01); H01L 21/02532 (2013.01); H01L 29/0847 (2013.01); H01L 29/165 (2013.01); H01L 29/7848 (2013.01);
Abstract

Semiconductor devices including semiconductor junctions and semiconductor field effect transistors that exploit the straining of semiconductor materials to improve device performance are provided. Also described are methods for making semiconductor structures. Dislocation defect-free epitaxial grown structures that are embedded into a semiconductor base are provided. The epitaxial structures can extend beyond the surface of the semiconductor base and terminate at a faceted structure. The epitaxial structures are formed using a multilayer growth process that provides for continuous transitions between adjacent layers.


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