The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Jan. 10, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Kei Kodera, Kyoto, JP;

Masaji Furuta, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/14 (2006.01); H01J 49/04 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/401 (2013.01); H01J 49/0409 (2013.01); H01J 49/14 (2013.01); H01J 49/164 (2013.01); H01J 49/40 (2013.01);
Abstract

A metallic plate holderis directly placed on a flat bottom plateof a sample chamber. A linear guideextending in x-direction is located below the bottom plate. Another linear guideextending in y-direction is fixed to a movable partof the linear guide. A magnet, fixed to a movable partof the linear guide, magnetically attracts the plate holder across the bottom plate. When the magnet is two-dimensionally driven by the linear guides, the plate holder follows it and moves two-dimensionally. The flat bottom plate limits the z-position of the plate holder, thereby reducing the fluctuation in the level of the sample on a sample platedue to the movement. Thus, the variation in the level at different positions on the sample plate is reduced, so that the number of times of a calibrant measurement can be decreased.


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