The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Jul. 22, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Rohit Sethi, Mountain View, CA (US);

Lejing Wang, Sunnyvale, CA (US);

Jonathan Pokrass, Herzliya, IL;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/521 (2017.01); H04N 17/00 (2006.01); H04N 5/247 (2006.01); G06T 7/73 (2017.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/521 (2017.01); G06T 7/74 (2017.01); H04N 5/2257 (2013.01); H04N 5/23216 (2013.01); H04N 5/247 (2013.01); H04N 17/002 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10048 (2013.01);
Abstract

In one implementation, a device has a processor, a projector, a first infrared (IR) sensor, a second IR sensor, and instructions stored on a computer-readable medium that are executed by the processor to estimate the sensor-to-sensor extrinsic parameters. The projector projects IR pattern elements onto an environment surface. The first sensor captures a first image including first IR pattern elements corresponding to the projected IR pattern elements and the device estimates 3D positions for first IR pattern elements. The second IR sensor captures a second image including second IR pattern elements corresponding to the projected IR pattern elements and the device matches the first IR pattern elements and the second IR pattern elements. Based on this matching, the device estimates a second extrinsic parameter corresponding to a spatial relationship between the first IR sensor and the second IR sensor.


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