The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Nov. 29, 2018
Applicant:
Samsung Display Co., Ltd., Yongin-si, KR;
Inventor:
Byoung Kwan An, Suwon-si, KR;
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 11/00 (2006.01); G09G 3/00 (2006.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/11 (2017.01); G06T 11/001 (2013.01); G06T 11/203 (2013.01); G09G 3/006 (2013.01); G09G 2330/10 (2013.01);
Abstract
A defect detection apparatus including a region setter which sets a region of interest in an image including a plurality of pixels, and a defect detector which divides the region of interest into a plurality of segments and generates a trend line for each of the segments based on gray level values of the pixels. Here, the defect detector detects a stain in the image by comparing the gray level values of the pixels with the trend line.
An, Byoung. (2020). Defect detection apparatus and method (U.S. Patent No. 10867381). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10867381
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