The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Mar. 03, 2017
Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong, HK;
Yang Liu, Hong Kong, HK;
Chao Feng, Shenzhen, CN;
Zhengmairuo Gan, Shenzhen, CN;
Zhi Bin Lei, Hong Kong, HK;
Yi Xiang, Hong Kong, HK;
Abstract
A method for annotating a batch of original samples is provided. A first subset of original samples, selected from the batch and determined by minimizing an entropy-mean difference between the first subset and the batch, is used for human annotation to yield human-annotated samples. The human-annotated samples are used as training data to configure an annotation process for annotating an input sample to yield an annotated output sample, and a check process for verifying annotation accuracy of the annotated output sample. Remaining original samples in the hatch are processed by the annotation process to yield machine-annotated samples, whose accuracy is verified by the check process. In one embodiment, part of the original samples corresponding to erroneous machine-annotated samples are selected for human annotation. Resultant additional human-annotated samples are used to update the two processes. The remaining original samples not yet annotated are then processed by the two processes.