The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Nov. 30, 2017
Fujitsu Limited, Kawasaki, JP;
The University of Tokyo, Tokyo, JP;
Daisuke Kushibe, Kawasaki, JP;
Masahiro Watanabe, Kawasaki, JP;
Toshiaki Hisada, Kashiwa, JP;
Seiryo Sugiura, Bunkyo, JP;
Takumi Washio, Bunkyo, JP;
Jun-ichi Okada, Bunkyo, JP;
FUJITSU LIMITED, Kawasaki, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
A streakline visualization apparatus sets a partial region including a discrete point at a first position on a first streakline in an analysis space as an analysis target region of the discrete point. Based on a velocity of fluid in the analysis target region indicated by fluid information, the apparatus calculates a second position indicating a destination of a particle on the discrete point at a second analysis time point. Next, based on information about a structure in the analysis target region indicated by structure information, the apparatus determines a region occupied by the structure in the analysis target region at the second analysis time point. Next, based on the first and second positions, the apparatus determines whether a second streakline has entered the occupied region. If the second streakline has not entered the occupied region, the apparatus displays the second streakline passing through the second position.