The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

May. 10, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Alok Gupta, San Ramon, CA (US);

John Spirtos, Boston, MA (US);

Robert Schwaber, Boston, MA (US);

Andrew Chappell, San Ramon, CA (US);

Ashish Jain, Menlo Park, CA (US);

Alex Tepper, Norwalk, CT (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/16 (2019.01); G01M 11/08 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06F 16/164 (2019.01); G01M 11/081 (2013.01); G06Q 10/20 (2013.01);
Abstract

In some embodiments, a meta-data inspection data store may contain hierarchical components and subcomponents of an industrial asset and define points of interest. An industrial asset inspection platform may access that information and generate an inspection plan, including an association of at least one sensor type with each of the points of interest. The platform may then store information about the inspection plan in an inspection plan data store and receive inspection data (e.g., from a manual inspection, from an inspection robot, from a fixed sensor, etc.). A smart tagging algorithm may be executed to associate at least one point of interest with an appropriate portion of the received inspection data based on information in the inspection plan data store.


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