The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Oct. 11, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yo Taniguchi, Tokyo, JP;

Hisaaki Ochi, Tokyo, JP;

Toru Shirai, Tokyo, JP;

Yoshihisa Sotome, Tokyo, JP;

Suguru Yokosawa, Tokyo, JP;

Tomoki Amemiya, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/50 (2006.01); A61B 5/055 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/50 (2013.01); A61B 5/055 (2013.01); G01R 33/5618 (2013.01);
Abstract

A plurality of subject parameter maps are acquired at high speed. In addition to using an imaging sequence for generating both a gradient echo and a spin echo in a single imaging sequence, one or more parameters such as the longitudinal relaxation time T1 and the apparent transverse relaxation time T2* are calculated using the gradient echo and another parameter such as true transverse relaxation time T2 is calculated using the spin echo. When a value of one parameter is calculated, a value of the parameter calculated at the time of calculating the other parameter can be used.


Find Patent Forward Citations

Loading…