The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Aug. 30, 2018
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Jan-Peter Schat, Hamburg, DE;

Xiankun Jin, Austin, TX (US);

Tao Chen, Austin, TX (US);

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/3163 (2006.01); G01R 35/00 (2006.01); H03M 1/10 (2006.01); H03F 3/45 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3163 (2013.01); G01R 35/005 (2013.01); H03M 1/1009 (2013.01); H03F 3/45179 (2013.01);
Abstract

An example analog-test-bus (ATB) apparatus includes a plurality of comparator circuits, each having an output port, and a pair of input ports of opposing polarity including an inverting port and a non-inverting port, a plurality of circuit nodes to be selectively connected to the input ports of a first polarity, and at least one digital-to-analog converter (DAC) to drive the input ports of the plurality of comparator circuits. The apparatus further includes data storage and logic circuitry that accounts for inaccuracies attributable to the plurality of comparator circuits by providing, for each comparator circuit, a set of calibration data indicative of the inaccuracies for adjusting comparison operations performed by the plurality of comparator circuits.


Find Patent Forward Citations

Loading…