The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Jul. 13, 2018
Jvc Kenwood Corporation, Yokohama, JP;
Shigehiko Iwama, Yokohama, JP;
Makoto Itonaga, Yokohama, JP;
Yuichi Hasegawa, Yokohama, JP;
Koji Tsujita, Yokohama, JP;
Masayuki Ono, Yokohama, JP;
JVC KENWOOD CORPORATION, Yokohama, JP;
Abstract
An analysis device includes a turntable, an optical pickup, and a controller. The turntable holds a specimen analysis disc having reaction regions on which nanoparticles binding to substances to be detected are captured. The optical pickup emits laser light to each reaction region, receives a reflected light from each reaction region, and generates a light reception level signal. The controller sequentially generates a plurality of measurement gate signals for counting the number of the nanoparticles captured on each reaction region, counts the number of the nanoparticles of each of the measurement gate signals based on the light reception level signal, specifies a measurement gate section in each reaction region according to a measurement result per measurement gate signal, and adds up the number of the nanoparticles of the respective measurement gate signals in the measurement gate section.