The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Jun. 07, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Yuri Kato, Kanagawa, JP;

Yusuke Oike, Kanagawa, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01N 27/327 (2006.01); G01N 33/487 (2006.01); H03F 3/45 (2006.01); C12M 1/34 (2006.01); G01N 27/00 (2006.01); C12M 1/42 (2006.01); G01N 27/414 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4161 (2013.01); C12M 1/34 (2013.01); C12M 1/42 (2013.01); G01N 27/00 (2013.01); G01N 27/416 (2013.01); G01N 33/48728 (2013.01); G01N 33/48735 (2013.01); H03F 3/45188 (2013.01); G01N 27/3273 (2013.01); G01N 27/4148 (2013.01); H03F 2200/129 (2013.01); H03F 2200/156 (2013.01); H03F 2200/228 (2013.01); H03F 2200/396 (2013.01); H03F 2200/48 (2013.01); H03F 2203/45156 (2013.01); H03F 2203/45512 (2013.01); H03F 2203/45536 (2013.01);
Abstract

The present disclosure relates to a semiconductor device and a cell potential measuring apparatus capable of amplifying and reading a potential of solution with high accuracy. A reading electrode reads the potential of the solution. A differential amplifier includes a current mirror circuit. The reading electrode is connected to a first input terminal of the differential amplifier which is connected to a gate of a first input transistor connected to a diode-connected pMOS transistor of the current mirror circuit. An output terminal of the differential amplifier is connected to a second input terminal of the differential amplifier, which is connected to a gate of a second input transistor connected to a pMOS transistor of the current mirror circuit which is not diode-connected, via a capacitor. For example, the present disclosure is applied to the cell potential measuring apparatus and the like.


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