The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Mar. 10, 2016
Microbix Biosystems Inc., Mississauga, CA;
Randall Marks, San Jose, CA (US);
Mark Luscher, Toronto, CA;
Edward Lao, South San Francisco, CA (US);
John Patrick Myers, Milpitas, CA (US);
MICROBIX BIOSYSTEMS INC., Mississauga, CA;
Abstract
A method of configuring an optical system to reduce variations in measured properties of an analyte includes selecting a number of beams into which radiation from a source of radiation is to be split, wherein, upon irradiating the analyte from a plurality of directions by the number of beams, a variation of a resulting measurement of the analyte is at or below a threshold. The method further includes aligning the source of radiation and a plurality of optical elements optically coupled to the source of radiation such that the selected number of beams irradiate the analyte upon emission of radiation by the source of radiation.