The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Feb. 11, 2020
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Yoshiyuki Kondo, Tokyo, JP;
Yoshiteru Komuro, Tokyo, JP;
Atsushi Kodama, Tokyo, JP;
Koichi Tanimoto, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A particle diameter acquisition device includes an intensity distribution acquisition unit configured to acquire an intensity distribution of scattered light scattered from a multi-phase flow including dispersed phase at the time of irradiating the multi-phase flow with irradiation light, an attenuation gradient acquisition unit configured to acquire an attenuation gradient in the intensity distribution on the basis of the intensity distribution of the scattered light, a concentration acquisition unit configured to acquire a concentration of the dispersed phase in the multi-phase flow, a database configured to store intensity distribution data which is an intensity distribution of scattered light for each particle diameter and concentration of a dispersed phase, and a particle diameter acquisition unit configured to acquire a particle diameter of the dispersed phase on the basis of the acquired attenuation gradient, concentration, and intensity distribution data with reference to the intensity distribution data.