The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Jun. 08, 2017
Applicant:

Illinois Tool Works Inc., Glenview, IL (US);

Inventors:

Sunder Ramasubbu, Bangalore, IN;

Somayya Ammanagi, Bangalore, IN;

Assignee:

Illinois Tool Works Inc., Glenview, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/10 (2006.01); G01L 5/10 (2020.01); G05D 15/01 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
G01N 3/10 (2013.01); G01L 5/10 (2013.01); G05B 13/025 (2013.01); G05D 15/01 (2013.01); G01N 2203/0202 (2013.01); G01N 2203/0676 (2013.01);
Abstract

A test system for testing a specimen include (a) a set of actuators for applying a desired time history of load to a specimen, (b) a drive unit connected to each actuator, (c) power generating elements (current/pneumatic/hydraulic) and (d) a controller connected to the drive units, the controller generates a drive signal for the drive unit based on feedback received from output of the specimen and an error derived from the feedback and an input command. The controller generates the drive signal by compensating varying system parameters which are introduced due to nonlinear response of the test system and the specimen, wherein the controller does not require (i) additional measured variable other than a feedback received from the specimen and (ii) a numerical model of the test system and the specimen.


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Ramasubbu, Sunder. (2020). Testing system with real-time compensation of varying system parameters (U.S. Patent No. 10866176). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10866176

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