The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Mar. 24, 2017
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Kenji Mashio, Tokyo, JP;

Takashi Azuma, Tokyo, JP;

Susumu Shiizuka, Tokyo, JP;

Takae Yamashita, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 23/02 (2006.01); G06F 11/07 (2006.01); G01M 13/04 (2019.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); G05B 23/024 (2013.01); G05B 23/0221 (2013.01); G01M 13/04 (2013.01); G05B 2219/31477 (2013.01); G06F 11/0751 (2013.01);
Abstract

Among a plurality of sensors that detect a state of a control subject, a relationship fluctuation level between a magnitude of a signal output by a subject sensor and a magnitude of a signal output by another related sensor is calculated for each subject sensor and related sensor combination. Moreover, the subject sensor and related sensor combinations for which a value of the relationship fluctuation level is a predetermined value or more are identified, and a respective number of appearances of the subject sensor and the related sensor included in the identified combinations thereof is calculated.


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