The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Mar. 28, 2019
Sharp Kabushiki Kaisha, Sakai, JP;
The University of Tokyo, Tokyo, JP;
Takahiro Doe, Sakai, JP;
Hirofumi Yoshikawa, Sakai, JP;
Tazuko Kitazawa, Sakai, JP;
Yasuhiko Arakawa, Tokyo, JP;
SHARP KABUSHIKI KAISHA, Sakai, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
An infrared photodetection system is provided that is capable of measuring infrared light up to high-temperature regions while improving a temperature resolution for low-temperature regions without increasing image-acquisition time even if the measuring temperature range varies. The infrared photodetection system is set up to exhibit sensitivity spectrum SSPfor high sensitivity (for low temperature use) and sensitivity spectrum SSPfor low sensitivity (for high temperature use) in the transmission band of the bandpass filter when different voltages are applied to a quantum-dot infrared photodetector. The infrared photodetection system then integrates temperature data for the infrared light detected using sensitivity spectrum SSPand temperature data for the infrared light detected using sensitivity spectrum SSP, in order to output a temperature distribution in a measurement region.