The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Sep. 18, 2019
Applicant:

Dmg Mori Co., Ltd., Nara, JP;

Inventors:

Shun Okuyama, Kanagawa, JP;

Akinori Suzuki, Kanagawa, JP;

Assignee:

DMG MORI CO., LTD., Nara, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G01B 11/02 (2006.01); G02B 27/28 (2006.01); G02F 1/13363 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G01B 11/026 (2013.01); G02B 27/283 (2013.01); G02F 1/13363 (2013.01); G02B 27/10 (2013.01); G02F 2001/133638 (2013.01);
Abstract

The invention corresponds to wide signal period with simple structure by providing a relative position detection means for optically detecting a relative position of displacement of an object to be measured in a measuring direction. The invention includes a target mounted on the object to be measured and irradiated with light from a light source; a light receiver for detection of a relative position for receiving light by changing polarization state of reflected light at the target with respect to the light; and a relative position information output unit for outputting relative position information based on displacement of the target in the measuring direction. The target may include a reflector mounted on the object to be measured and a plurality of birefringent members provided on the reflector and having a thickness changing from a tip to a base end along the measuring direction.


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