The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Mar. 13, 2017
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Hyun Suk Kim, Daejeon, KR;

Hyun Jee Yoo, Daejeon, KR;

Jung Ok Moon, Daejeon, KR;

Jung Woo Lee, Daejeon, KR;

Se Woo Yang, Daejeon, KR;

Assignee:

LG CHEM, LTD., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 15/08 (2006.01); B32B 27/18 (2006.01); B32B 15/085 (2006.01); C08J 5/18 (2006.01); H01L 51/52 (2006.01); H01L 51/56 (2006.01); B32B 15/088 (2006.01); B32B 15/092 (2006.01);
U.S. Cl.
CPC ...
B32B 15/085 (2013.01); B32B 15/08 (2013.01); B32B 27/18 (2013.01); C08J 5/18 (2013.01); H01L 51/5203 (2013.01); H01L 51/5243 (2013.01); H01L 51/56 (2013.01); B32B 15/088 (2013.01); B32B 15/092 (2013.01); C08J 2323/22 (2013.01); C08J 2491/00 (2013.01); H01L 51/5259 (2013.01);
Abstract

The present application relates to an encapsulating film, a reliability assessment therefor, an organic electronic apparatus comprising the encapsulating film, and a method for producing an organic electronic apparatus which has used the encapsulating film, and provides: a reliability assessment method which can predict the reliability of the encapsulating film before same is applied to the organic electronic apparatus, the encapsulating film blocking moisture or oxygen from the outside entering the organic electronic apparatus; and the encapsulating film which can block moisture with high reliability.


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