The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Mar. 17, 2017
Applicant:

Electro Scientific Industries, Inc., Portland, OR (US);

Inventors:

Yuan Liu, Portland, OR (US);

Honghua Hu, Portland, OR (US);

Jim Brookhyser, Portland, OR (US);

Guangyu Li, Portland, OR (US);

Brandon Bilyeu, Portland, OR (US);

Kurt Eaton, Portland, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/02 (2014.01); B23K 26/03 (2006.01); B23K 26/082 (2014.01); B23K 26/00 (2014.01); B23K 26/384 (2014.01); B23K 26/06 (2014.01); B23K 26/073 (2006.01); B23K 26/08 (2014.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); B23K 26/00 (2013.01); B23K 26/0626 (2013.01); B23K 26/073 (2013.01); B23K 26/082 (2015.10); B23K 26/384 (2015.10);
Abstract

Disclosed is a method and an apparatus to process a workpiece including producing a first beam of laser energy characterized by a first spatial intensity distribution. A first workpiece is processed using the first beam of laser energy to form a plurality of features at a first distance between the scan lens and the first workpiece and forming a second features at a second distance. The method includes determining which of the plurality of features has a shape that most closely resembles the shape of the first spatial intensity distribution and setting a process distance as the distance that produced that feature. Using this process distance, a surface of a second workpiece is processed using second beam of laser energy with a second spatial intensity distribution.


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