The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2020
Filed:
Sep. 18, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Taro Shirai, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Satoshi Sano, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Naoki Morimoto, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/4291 (2013.01); A61B 6/583 (2013.01);
Abstract
This X-ray phase difference imaging system () includes an X-ray source (), a plurality of gratings, a detector (), and an image processor (), in which the image processor () is configured to correct an artifact of a second phase contrast image () that is reconstructed by using a first X-ray image () and a third X-ray image (), on the basis of a first phase contrast image () that is reconstructed by using the first X-ray image () and a second X-ray image ().