The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Aug. 13, 2015
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Thilo Hannemann, Erlangen, DE;

Soren Kuhrt, Erlangen, DE;

Johann Uebler, Nuremberg, DE;

Bernhard Weyermann, Hoechstadt, DE;

Assignee:

SIEMENS HEALTHCARE GMBH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 5/00 (2006.01); A61B 6/03 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/469 (2013.01); A61B 5/0075 (2013.01); A61B 5/0077 (2013.01); A61B 5/744 (2013.01); A61B 6/032 (2013.01); A61B 6/0492 (2013.01); A61B 6/463 (2013.01); A61B 6/466 (2013.01); A61B 6/488 (2013.01); A61B 6/547 (2013.01);
Abstract

A method and a device are disclosed for controlling a scanning region of a medical imaging system for subsequent recording of a region of interest of an examination object. Depth image data of the examination object are captured. 2-D image data of at least one 2-D image of the examination object are created and the 2-D image is displayed. The 2-D image data and the depth image data of the examination object are registered to each other at least in some regions. By using the 2-D image, at least one limit position of the scanning region is then determined. Finally, on the basis of the depth image data and the limit position in the 2-D image of the examination object, a limit contour line extending through the limit position is determined and displayed such that the limit contour line is superimposed on the 2-D image of the examination object.


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