The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Mar. 03, 2017
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Ajan Daniel Kutty, Austin, TX (US);

Marcelo Benetti DeSouza, Austin, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 7/20 (2006.01);
U.S. Cl.
CPC ...
H05K 7/20836 (2013.01);
Abstract

A thermal test system includes first and second heat generating components that include first and second temperature sensors, respectively. A thermal controller is coupled to the first and second temperature sensors and at least one cooling device. The thermal controller receives, from the first temperature sensor during a thermal test, first temperature data that is indicative of heat generated in response to the operation of the first heat generating component, as the first heat generating component and the second heat generating component operate as part of the thermal test. The thermal controller also receives, from each second temperature sensor during the thermal test, second temperature data that is indicative of heat generated in response to the operation of the second heat generating component. The thermal controller then operates the at least one cooling device at a level based on the first temperature data while ignoring the second temperature data.


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