The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Dec. 08, 2019
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Jie-Ci Yang, New Taipei, TW;

Meng-Chao Kao, New Taipei, TW;

Wen-Kuong Liu, New Taipei, TW;

Tsang-Hsing Lee, New Taipei, TW;

Li-Ping Pan, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); G06T 7/00 (2017.01); G06T 7/40 (2017.01); G10L 21/14 (2013.01); G10L 21/18 (2013.01);
U.S. Cl.
CPC ...
H04R 29/001 (2013.01); G06T 7/0002 (2013.01); G06T 7/40 (2013.01); G10L 21/14 (2013.01); G10L 21/18 (2013.01); H04R 29/008 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A method and a system for vision-based defect detection are proposed. The method includes the following steps. A test audio signal is outputted to a device-under-test (DUT), and a response signal of the DUT with respect to the test audio signal is received to generate a received audio signal. Signal processing is performed on the received audio signal to generate a spectrogram, and whether the DUT has a defect is determined through computer vision according to the spectrogram.


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